Master in Microelectronics Technology and Manufacturing Management
Module 3.3 - Test & Testability
Detail
3.3.1 - Basic of testing
Program focus
This 3-hour session gives an overview of the semiconductor testing activity.
After showing its importance, it presents the different test modes and
techniques.
Benefits
At the end of this course, you will gain knowledge of the main challenges
related to the test of integrated circuits.
3.3.2 - Design for Test
Program focus
This 12-hour course explain the fundamental of test technology and hence
the “why” of Design for Test. It covers the basics solutions:
scan, BIST, boundary scan and associated technologies
Benefits
At the end of the course, you will have a global knowledge of test technology.
3.3.3 - Parametric Test
Program focus
This 6-Hour course reviews elementary and complex structures used for
parametric test. Highlight links between
Design Rules , Models and Parametric test
Benefits
At the end of the course, you will be more effective in understanding
and anticipating basic components used for development, production ….